X-ray powder diffraction for charge density studies

X-Ray Powder Diffraction Metrics

To compare sample data from x-ray diffraction a suitable metric is developed to evaluate the similarity (or dissimilarity) between samples and to compare it to a references. The methodology focuses on the d-lines and uses the intensity measurements indirectly in the algorithm. The resulting d-line distribution and summary statistics of the differences is used to establish whether a true differe...

X - Ray Diffraction from Pinned Charge Density Waves

We present an x-ray study of doped charge density waves systems. When a 2k f-charge density wave is strongly pinned to impurities, an interference effect gives rise to an asymmetry between the intensities of the +2k f and −2k f satellite reflections. Moreover, profile asymmetry of the satellite reflections indicates the existence of Friedel oscillations (FOs) around the defects. We have studied...

Two-dimensional X-ray powder diffraction

X-ray powder diffraction on proteins

Macromolecular structures are traditionally determined by means of single crystal X ray diffraction from protein crystals of micrometer dimensions. Nevertheless, the growth of good quality single crystals can be very difficult or even impossible, especially in cases of large proteins, membrane proteins or protein complexes. Modern developments of X-ray powder diffraction have allowed the struct...

X-ray Powder Diffraction Pattern Indexing for Pharmaceutical Applications

Crystal-structure determination using X-ray diffraction from single crystals is a well-developed technique (1). A single crystal structure provides full structural characterization of the form at the atomic scale. The main drawback to single crystal diffraction is the need to grow a sufficiently large and defect-free crystal for analysis, which is not practical for all crystal forms. Furthermor...